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A. C. Tamboli, E. D. Haberer, R. Sharma, K. H. Lee, S. Nakamura, E. L. Hu, Roomtemperature
continuous-wave lasing in GaN/InGaN microdisks, Nature Photonics 1, 61
(2006)
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C. Meier, K. Hennessy, E. D. Haberer, R. Sharma, Y. S-. Choi, K. McGroddy, S. Keller, S.
P. DenBaars, S. Nakamura, E. L. Hu, Visible resonant modes in GaN-based photonic crystal
membrane cavities, App. Phys. Lett. 88, 031111 (2006)
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Y. -S. Choi, K. Hennessy, R. Sharma, E. Haberer, Y. Gao, S. P. DenBaars, S. Nakamura, E.
L. Hu, C. Meier, GaN blue photonic crystal membrane nanocavities, App. Phys. Lett. 87,
243101 (2005)
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R. Sharma, E. D. Haberer, C. Meier, E. L. Hu, S. Nakamura, Vertically oriented GaN-based
air-gap distributed Bragg reflector structure fabricated using band-gap-selective
photoelectrochemical etching, App. Phys. Lett. 87, 051107 (2005)
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E. D. Haberer, R. Sharma, C. Meier, A. R. Stonas, S. Nakamura, S. P. DenBaars, E. L. Hu,
Freestanding, optically-pumped, GaN/InGaN microdisk lasers fabricated by
photoelectrochemical etching, App. Phys. Lett. 85, 5179 (2004)
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E. D. Haberer, C. Meier, R. Sharma, A. R. Stonas, S. P. DenBaars, S. Nakamura, E. L. Hu,
Observation of high Q resonant modes in optically pumped GaN/InGaN microdisks
fabricated using photoelectrochemical etching, Phys. Stat. Sol. (c) 2, 2845 (2005).
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E. D. Haberer, R. Sharma, A. R. Stonas, S. Nakamura, S. P. DenBaars, E. L. Hu, Removal of
thick InGaN layers for optical devices using bandgap-selective photoelectrochemical etching,
App. Phys. Lett. 85, 762 (2004)
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E. D. Haberer, M. Woods, A. Stonas, C-H. Chen, S. Keller, M. Hansen, U. Mishra, S.
DenBaars, J. Bowers, E. L. Hu, Investigation of sidewall recombination in GaN using a
quantum well probe. GaN and Related Alloys - 2000. Symposium (Materials Research
Society Symposium Proceedings Vol.639). Mater. Res. Soc. 2001, pp.G11.21.1-5.
Warrendale, PA, USA.
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E. D. Haberer, C-. H. Chen, M. Hansen, S. Keller, S. P. DenBaars, U. K. Mishra, E. L. Hu,
Enhanced diffusion as a mechanism for ion-induced damage propagation in GaN. J. Vac.
Sci. Technol. B 19, 603 (2001)
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E. D. Haberer, C-. H. Chen, A. Abare, M. Hansen, S. P. DenBaars, L. Coldren, U. K.
Mishra, E. L. Hu. Channeling as a Mechanism for Dry Etch Damage in GaN, App. Phys.
Lett. 76, 3941 (2000)
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C-. H. Chen, S. Keller, E. D. Haberer, L. Zhang, S. P. DenBaars, E. L. Hu, U. K. Mishra, Cl2
reactive ion etching for gate recessing of AlGaN/GaN field-effect transistors. J. Vac. Sci.
Technol. B 17, 2755 (1999)
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